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Low-temperature sample rod

Low-temperature sample rod

We offer a variety of low-temperature test sample rods, which can be customized as needed.

Low-temperature sample rod Overview

The low-temperature sample rod is specially designed for low-temperature tests to achieve precise temperature variation and control of samples. Provide sample rods that are compatible with various liquid helium and liquid nitrogen dewar. Various low-temperature magnetic field systems: such as Oxford low-temperature magnetic field systems, PPMS, etc., Top loading sample rods of various low-temperature thermostats.


Factors to consider when customizing low-temperature sample rods
• Matching installation dimensions, such as: mating flange, sample rod length, etc.
• Low-temperature environment of the sample rod, such as: liquid, static atmosphere, dynamic atmosphere;
• Introduced optical signals, such as: optical fibers;
• Introduced electrical signals, such as: DC leads, RF leads, etc.
• Electrical test connectors, such as: BNC, three-coaxial, SMA, LEMO, aviation plugs, etc.
• Sample cards, such as probe sample cards, radio frequency sample cards, multi-electrode sample cards, etc.
• The motion device of the sample rod, such as: linear displacement, rotation;
• The movement of the sample, such as: displacement and rotation along the X, Y, and Z axes;
• Temperature control requirements, such as: cooling capacity, temperature range, and whether it is applied in a magnetic field and radiation environment;
• Test cables, such as: temperature controller cables, test instrument cables;
• Junction box.

Low-temperature sample rod Technical Parameter

Low-temperature sample rod Basic Configuration

Semiconductor
IC
Wafer

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